松尾 吉晃

<jats:title>Abstract</jats:title><jats:p>In this review, fundamental aspects of the electrochemical intercalation of anions into graphite have been first summarized, and then described the electrochemical preparation of covalent‐type GICs and application of graphite as the cathode of dual‐ion battery. Electrochemical overoxidation of anion GICs provides graphite oxide and covalent‐fluorine GICs, which are key functional materials for various applications including energy storage devices. The reaction conditions to obtain fully oxidized graphite has been mentioned. Concerning the application of graphite for the cathode of dual‐ion battery, it stably delivers about 110 mA h g<jats:sup>−1</jats:sup> of reversible capacity in usual organic electrolyte solutions. The combination of anion and solvent as well as the concentration of the anions in the electrolyte solutions greatly affect the performance of graphite cathode such as oxidation potential, rate capability, cycling properties, etc. The interfacial phenomenon is also important, and fundamental studies of charge transfer resistance, anion diffusion coefficient, and surface film formation behavior have also been summarized. The use of smaller anions, such as AlCl<jats:sub>4</jats:sub><jats:sup>−</jats:sup>, Br<jats:sup>−</jats:sup> can increase the capacity of graphite cathode. Several efforts on the structural modification of graphite and development of electrolyte solutions in which graphite cathode delivers higher capacity were also described.</jats:p>

<jats:title>Abstract</jats:title> <jats:p>The effects of soft X-ray irradiation and atomic hydrogen annealing (AHA) on the reduction of graphene oxide (GO) to obtain graphene were investigated. To clarify the interaction between soft X-rays and GO, soft X-rays of 300 eV and 550 eV were used for C 1s and O 1s inner-shell electron excitation, respectively at the NewSUBARU synchrotron radiation facility. Low-temperature reduction of the GO film was achieved by using soft X-ray at temperatures below 150 °C at 300 eV, and 60 °C at 550 eV. O-related peaks in X-ray photoelectron spectroscopy, such as the C–O–C peak, were smaller at 550 eV than those at 300 eV. This result indicates that excitation of the core–shell electrons of O enhances the reduction of GO. Soft X-rays preferentially break C–C and C–O bonds at 300 and 550 eV, respectively.</jats:p>