Masafumi Kobune, Yusaku Kaneko, Ryo Kishimoto, Takuya Kugimiya, Satoshi Ueshima, Hiroshi Nishioka, Takeyuki Kikuchi, Hironori Fujisawa, Seiji Nakashima, Masaru Shimizu, Naoki Fukumuro, Hitoshi Matsuda
Japanese Journal of Applied Physics 52(9 PART2) 2013年9月
a- and b-axis-oriented (Bi3.25Nd0.75-xEu x)Ti3O12 (BNEuT, x = 0-0.75) films of 3.0 μm thickness were fabricated on conductive Nb:TiO2(101) substrates containing 0.79 mass% Nb by high-temperature sputtering at 650 °C, and their structural and ferroelectric characteristics were investigated. All the films had a mostly single-phase orthorhombic structure, with high degrees of a- and b-axis orientations of 99.0-99.8%. The lattice parameters (a-, b-, and c-axis lengths) and the calculated orthorhombic lattice distortion decreased monotonically with increasing Eu content. The microstructure of BNEuT films with x = 0-0.50 was nanoplate-like, whereas that of films with x ≥ 0:60 was significantly more bulklike. The real room-temperature remanent polarization (2Pr*), taking the porosity between the nanoplates into account, had a maximum value of 2Pr* = 87 μC/cm2 at x = 0.10, which was approximately 1.3 times larger than that (65 μC/cm2) of the nondoped BNT film. It is shown that lattice distortion caused by rotation of octahedra in the a-b plane due to the Eu substitution plays a significant role in the improvement of ferroelectricity. © 2013 The Japan Society of Applied Physics.