Kinoshita Toyohiko, Takata Yasutaka, Kimura Shinichi, Kimura Shin-ichi, Okuno Mitsuru, Haruyama Yuichi, Kosugi Nobuhiro, Nath Krishna Gopal, Wada Hirofumi, Mitsuda Akihiro, Shiga Masayuki, Okuda Taichi, Harasawa Ayumi, Ogasawara Haruhiko, Kotani Akio
Journal of the Physical Society of Japan 71(1) 148-155 2002年
The resonant photoemission spectra and X-ray absorption spectra of temperature-induced valence transition material EuNi2(Si1-xGex)2 around Eu $3d$–$4f$, $4d$–$4f$ and Ni $2p$–$3d$ resonant excitation regions have been measured. From the comparison between the resonant photoemission spectra around the $3d$–$4f$ (bulk sensitive) and $4d$–$4f$ (surface sensitive) excitation regions, the Eu divalent component originating from the surface is separated from the bulk one. The divalent and the trivalent features of $4f$ electrons are obviously distinguished depending on the excitation conditions. It was confirmed that the intensity ratio of the $4f$ electronic structures between the Eu divalent and trivalent ions changes as a function of the temperature. The mean valence values estimated from the Eu $M$-edge X-ray absorption spectra and from the photoemission spectra were rather smaller than those obtained previously from the $L$-edge X-ray absorption spectra. The reason of the discrepancy is discussed. The spectral features and the resonant behaviors are well explained by a theoretical calculation based on the atomic model except for the strong contribution from the Ni $3d$ bands. In the resonant condition of the Eu divalent component, the spin flip satellite beside the $4f$ divalent states was observed. The photoemission spectra around the Ni $2p$–$3d$ excitation region show similar behavior to that of Ni pure metal.