Steven C. Moss, Daisuke Kobayashi, Arto Javanainen, Dale McMorrow, Stephen LaLumondiere, Manuel Cabanas-Holman (担当:分担執筆, 範囲:Basics of single event effect mechanisms and predictions)
H. Takahashi, Y. Okamoto, T. Hamada, Y. Komura, S. Watanabe, K. Tsuda, H. Sawai, T. Matsuzaki, Y. Ando, T. Onuki, H. Kunitake, D. Kobayashi, A. Ikuta, T. Makino, T. Ohshima, S. Yamazaki
IEEE International Reliability Physics Symposium (IRPS)