Profile Information
- Affiliation
- Associate Professor, Institute of Space and Astronautical Science, Department of Spacecraft Engineering, Japan Aerospace Exploration AgencyAssociate Professor, The Graduate School of Engineering, Department of Electrical Engineering and Information Systems, The University of Tokyo
- Degree
- D.S.(Mar, 2005, The University of Tokyo)
- Researcher number
- 90415894
- ORCID ID
https://orcid.org/0000-0002-0140-8820- J-GLOBAL ID
- 200901096574214055
- researchmap Member ID
- 5000089715
- External link
Our daily life relies on computers and their computation units of computer chips. We usually have an impression that they are always correct and reliable, but do you know this impression is a result of many researchers' efforts? Researchers are working for making computer chips tough against sudden shocks, and otherwise the chips can be easily surprised and lose their memory. This memory loss phenomenon is technically called "soft errors" and "single-event upsets", but rather than those technical terms I'd prefer to say simply, "computers can be surprised", which brings a clear image into mind. What makes them surprised? We can find it in some places including twinkle stars in space. From the stars invisible high-energy fragments come and travel in space; some of them arrive at the ground. They can give a shock to computer chips---an electric shock it is literally. Researchers are working for countermeasures against the shock in order to make computer chips be entrusted. Communicating with each other, some researchers are working for mainly how to protect the chips on the ground and others for the chips in space. I'm working for the latter, for the use in space, as a member of the Institute of Space and Astronautical Science, Japan Aerospace Exploration Agency. For the successful use of computer chips in space, we have other issues to be solved; computers can be tired! I'd collectively call them space-chip engineering, which is my current research topic.
Research Interests
12Research Areas
1Major Research History
8Major Education
2Committee Memberships
1-
2013 - Mar, 2020
Major Awards
8Papers
46-
IEEE Transactions on Nuclear Science, 70(4) 707-713, Apr, 2023 Peer-reviewedLead authorCorresponding author
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IEEE Transactions on Nuclear Science, 68(3) 232-240, Mar, 2022 Peer-reviewedLead authorCorresponding author
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IEEE Transactions on Nuclear Science, 68(6) 1222-1227, 2021 Peer-reviewed
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IEEE Transactions on Nuclear Science, 68(2) 124-148, 2021 Peer-reviewedLead authorCorresponding author
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Japanese Journal of Applied Physics, 59(10) 106501-106501, Oct 1, 2020 Peer-reviewed
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Quantum Beam Science, 4(1) 15, Mar 4, 2020 Peer-reviewed
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IEEE Transactions on Nuclear Science, 67(1) 328-335, Jan, 2020 Peer-reviewedLead authorCorresponding author
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IEEE Transactions on Device and Materials Reliability, 19(4) 751-756, Dec, 2019 Peer-reviewed
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IEEE Transactions on Nuclear Science, 66(1) 155-162, Jan, 2019 Peer-reviewedLead authorCorresponding author
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IEEE Transactions on Device and Materials Reliability, 18(4) 574-582, Dec, 2018 Peer-reviewed
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IEEE Transactions on Nuclear Science, 65(8) 1900-1907, Aug, 2018 Peer-reviewed
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Physica B: Condensed Matter, 532 99-102, Mar, 2018 Peer-reviewed
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IEEE Transactions on Nuclear Science, 65(1) 346-353, Jan, 2018 Peer-reviewed
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IEEE Transactions on Nuclear Science, 65(1) 523-532, Jan, 2018 Peer-reviewedLead authorCorresponding author
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Japanese Journal of Applied Physics, 56(8) 0802A5-0802A5, Aug 1, 2017 Peer-reviewed
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Japanese Journal of Applied Physics, 56(8) 0802B3-0802B3, Aug 1, 2017 Peer-reviewed
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Japanese Journal of Applied Physics, 56(8) 0802B4-0802B4, Aug 1, 2017 Peer-reviewedLead authorCorresponding author
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Japanese Journal of Applied Physics, 56(4S) 04CD16-04CD16, Apr 1, 2017 Peer-reviewed
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Journal of Applied Physics, 121(8) 085501-085501, Feb 28, 2017 Peer-reviewed
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IEEE Transactions on Nuclear Science, 64(1) 406-414, Jan, 2017 Peer-reviewed
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IEEE Transactions on Nuclear Science, 61(4) 1710-1716, Aug, 2014 Peer-reviewedLead authorCorresponding author
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IEEE Transactions on Nuclear Science, 59(4) 707-713, Aug, 2012 Peer-reviewed
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Japanese Journal of Applied Physics, 51 04DA07-04DA07, Apr 20, 2012 Peer-reviewed
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IEEE Transactions on Electron Devices, 58(8) 2362-2370, Aug, 2011 Peer-reviewed
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IEEE Transactions on Nuclear Science, 58(3) 800-807, Jun, 2011 Peer-reviewedLead authorCorresponding author
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Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 636(1) S31-S36, Apr, 2011 Peer-reviewed
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Journal of The Electrochemical Society, 158(5) R27-R36, 2011 Peer-reviewed
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IEEE Transactions on Nuclear Science, 57(4) 1811-1819, Aug, 2010 Peer-reviewed
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IEEE Transactions on Nuclear Science, 56(6) 3180-3184, Dec, 2009 Peer-reviewed
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IEEE Transactions on Nuclear Science, 56(6) 3043-3049, Dec, 2009 Peer-reviewedLead authorCorresponding author
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IEEE Transactions on Nuclear Science, 56(4) 1958-1963, Aug, 2009 Peer-reviewed
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IEEE Transactions on Nuclear Science, 56(4) 2014-2020, Aug, 2009 Peer-reviewed
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IEEE Transactions on Nuclear Science, 56(1) 202-207, Feb, 2009 Peer-reviewed
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IEEE Transactions on Nuclear Science, 55(6) 2872-2879, Dec, 2008 Peer-reviewedLead authorCorresponding author
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IEEE Transactions on Nuclear Science, 55(6) 2842-2853, Dec, 2008 Peer-reviewed
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Applied Physics Letters, 93(19) 193503, Nov 10, 2008 Peer-reviewed
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IEEE Transactions on Nuclear Science, 55(4) 1947-1952, Aug, 2008 Peer-reviewed
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IEEE Transactions on Nuclear Science, 54(6) 2347-2354, Dec, 2007 Peer-reviewedLead authorCorresponding author
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Journal of Physics: Conference Series, 83 012011-012011, Oct 1, 2007 Peer-reviewed
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IEEE Transactions on Nuclear Science, 54(4) 1037-1041, Aug, 2007 Peer-reviewedLead authorCorresponding author
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Time-domain component analysis of heavy-ion-induced transient currents in fully-depleted SOI MOSFETsIEEE Transactions on Nuclear Science, 53(6) 3372-3378, Dec, 2006 Peer-reviewedLead authorCorresponding author
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IEEE Transactions on Nuclear Science, 53(6) 3575-3578, Dec, 2006 Peer-reviewed
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Applied Physics Letters, 89(15) 154103-154103, Oct 9, 2006 Peer-reviewed
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IEEE Transactions on Electron Devices, 52(10) 2188-2197, Oct, 2005 Peer-reviewedLead authorCorresponding author
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Journal of Micromechanics and Microengineering, 14(9) S76-S81, Sep 1, 2004 Peer-reviewedLead authorCorresponding author
Major Misc.
5-
JSAP Review, 2023, Sep 2, 2023 InvitedLead authorCorresponding author
Major Books and Other Publications
3Presentations
66-
IEEE International Reliability Physics Symposium (IRPS)Presentation 4C.4
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Symposium on VLSI Technology and Circuits Invited
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IEEE International Reliability Physics Symposium (IRPS)
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SID International Display Week Symposium and Seminarpaper 9.1
Major Teaching Experience
2Professional Memberships
5Industrial Property Rights
5Major Academic Activities
18-
Panel moderator, Session chair, etc., Planning/Implementing academic research(San Antonio, TX, USA), Jul, 2019
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Supervision (editorial), Peer review2015 - 2017
Media Coverage
8-
IEEE, @Press, Jul 31, 2023 Internet
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D. Kobayashi, K. Hirose, and H. Saito, SPIE Newsroom, Jun, 2013 Internet
● 専任大学名
1-
Affiliation (university)総合研究大学院大学(SOKENDAI)