Curriculum Vitaes
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  2. Kazuyuki Hirose

Kazuyuki Hirose

  (廣瀬 和之)

Profile Information

Affiliation
Professor, Institute of Space and Astronautical Science, Japan Aerospace Exploration Agency
Degree
(BLANK)(Waseda University)
(BLANK)
J-GLOBAL ID
200901096979972445
researchmap Member ID
1000192906

Research Interests

 4

Research Areas

 2

Education

 2

Committee Memberships

 14
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Awards

 6
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Papers

 61
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Misc.

 284
  • Daisuke Kobayashi, Kazuyuki Hirose
    Oyo Buturi, 92(2) 89-93, Feb, 2023  
  • Kazuyuki Hirose, Daisuke Kobayashi, Taichi Ito, Tetsuo Endoh
    JAPANESE JOURNAL OF APPLIED PHYSICS, 56(8), Aug, 2017  
    The memory reliability of magnetic tunnel junctions has been examined from the aspect of their potential use in disaster-resilient computing. This computing technology requires memories that can keep stored information intact even in power-cut emergency situations. Such a requirement has been quantified as a score of acceptable flip probability, which is the failure in time (FIT) rate of 1 for a single-interface perpendicular magnetic tunnel junction (p-MTJ) with a disk diameter of 20 nm. For comparison with this acceptable probability, p-MTJ memory reliability has been evaluated. The risk of particle radiation bombardments, i.e., alpha particles and neutrons-the well-known soft error sources on the ground-has been evaluated from the aspects of both frequency of bombardments and the hazardous effects of bombardments. This study highlights that high-energy terrestrial neutrons may lead to soft errors in p-MTJs, but the flip probability, or the risk, is expected to be lower than 1 x 10(-6) FIT/p-MTJ, which is much smaller than the target probability. It has also been found that the use of p-MTJs can reduce the risk by three orders of magnitude compared with that of the conventional SRAMs. Few risks have been suggested for other radiation particles, such as alpha particles and thermal neutrons. (C) 2017 The Japan Society of Applied Physics
  • 天野裕士, 天野裕士, 小林大輔, 野平博司, 廣瀬和之
    応用物理学会春季学術講演会講演予稿集(CD-ROM), 62nd, 2015  
  • 83(8) 655-659, Aug, 2014  
  • Takanobu Shimada, Hiroyuki Toyota, Kazuyuki Hirose, Yoshitomo Maeda, Kazuhisa Mitsuda
    2014 IEEE 40TH PHOTOVOLTAIC SPECIALIST CONFERENCE (PVSC), 2161-2165, 2014  
    This paper presents analysis results for the onorbit performance of a solar array paddle of the X-ray astronomy satellite Suzaku. The current generated by the solar array was decreasing significantly for approximate one year after mid-2011. We estimated the degradation of the output by simulating the on-orbit environment according to the JPL prediction method. The analysis results indicate that the on-orbit degradation of the solar array paddle is greater than the predicted performance degradation in a space environment. We determined that the difference between the on-orbit data and the analysis results could be attributed to either an increase in cell temperature or radiation degradation due to solar flares.
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Books and Other Publications

 8
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Presentations

 34

Professional Memberships

 1

Research Projects

 16
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● 指導学生等の数

 1
  • Fiscal Year
    2018年度(FY2018)
    Doctoral program
    東大生　1名
    Master’s program
    東大生　2名
    Students under Commissioned Guidance Student System
    2名
    Students under Skills Acquisition System
    3名

● 指導学生の表彰・受賞

 1
  • Student Name
    Shintaro Toguchi
    Student affiliation
    東京大学
    Award
    the 2017 RADECS sponsorship
    Date
    2017.10

● 指導学生の顕著な論文

 12
  • Student name
    Hagimoto Ysuyuki
    Student affiliation
    東京大学
    Author(s), journal, volume number, pagination (year of publication)
    Y. Hagimoto, H. Fujioka, M. Oshima , and K. Hirose, Applied Physics Letters, 77(25), pp. 4175-4177 (2000)
    Title
    Characterizing carrier-trapping phenomena in ultrathin SiO2 films by using the x-ray photoelectron spectroscopy time-dependent measurements
    DOI
    http://doi.org/10.1063/1.1334657
  • Student name
    Emoto Takashi
    Student affiliation
    名古屋大学
    Author(s), journal, volume number, pagination (year of publication)
    T. Emoto,, K. Akimoto, A. Ichimiya, K. Hirose, Applied Surface Science, 190(1-4), pp. 113-120 (2002)
    Title
    Strain due to nickel diffusion into hydrogen-terminated Si(1 1 1) surface
    DOI
    https://doi.org/10.1016/S0169-4332(01)00852-2
  • Student name
    Talahashi Kensuke
    Student affiliation
    武蔵工業大学
    Author(s), journal, volume number, pagination (year of publication)
    K. Takahashi, H. Nohira, K. Hirose, and T. Hattori, Applied Physics Letters 83(16), pp. 3422-3424 (2003)
    Title
    Accurate determination of SiO2 film thickness by x-ray photoelectron spectroscopy
    DOI
    https://doi.org/10.1063/1.1616204
  • Student name
    Yanagawa Yoshimitsu
    Student affiliation
    東京大学
    Author(s), journal, volume number, pagination (year of publication)
    Y. Yanagawa, K. Hirose, H. Saito, D. Kobayashi, S. Fukuda, S. Ishii, D. Takahashi, K. Yamamoto, and Y. Kuroda, IEEE Transactions on Nuclear Science, 53 (6) pp. 3575-3578 (2006)
    Title
    Direct measurement of SET pulse widths in 0.2-μm SOI logic cells irradiated by heavy ions
  • Student name
    Makino Takahiro
    Student affiliation
    総合研究大学院大学
    Author(s), journal, volume number, pagination (year of publication)
    T. Makino, D. Kobayashi, K. Hirose, Y. Yanagawa, H. Saito, D. Takahashi, S. Ishii, M. Kusano, S. Onoda, T. Hirao, and T. Ohshima, IEEE Transactions on Nuclear Science, 56 (1) pp. 202-207 (2009)
    Title
    LET dependence of single event transient pulse-widths in SOI logic cell
    DOI
    https://doi.org/10.1109/TNS.2008.2009054
  • Student name
    Tsugawa Kazuo
    Student affiliation
    早稲田大学
    Author(s), journal, volume number, pagination (year of publication)
    K. Tsugawa, H. Noda, K. Hirose, and H. Kawarada, Physical Review B, 81 pp. 045303-1-0045303-11 (2010)
    Title
    Schottky barrier heights, carrier density, and negative electron affinity of hydrogen-terminated diamond
    DOI
    https://doi.org/10.1103/PhysRevB.81.045303
  • Student name
    Chikada Shunsuke
    Student affiliation
    早稲田大学
    Author(s), journal, volume number, pagination (year of publication)
    S. Chikada, K. Hirose, and T. Yamamoto, Japanese Journal of Applied Physics, 49 pp. 091502-1-091502-3 (2010)
    Title
    Analysis of local environment of Fe ions in hexagonal BaTiO3
    DOI
    https://doi.org/133.74.120.63 on 04/02/2021
  • Student name
    Kanamori Haruto
    Student affiliation
    早稲田大学
    Author(s), journal, volume number, pagination (year of publication)
    H. Kanamori, T. Yoshioka, K. Hirose, and T. Yamamoto, Journal of Electron Spectroscopy and Related Phenomena, 185 pp. 129-132 (2012)
    Title
    Determination of valence state of Mn ions in Pr1-xAxMnO3-δ (A = Ca, Sr) by Mn-L3 X-ray absorption near-edge structure analysis
    DOI
    https://doi.org/10.1016/j.elspec.2012.03.003
  • Student name
    Motoki Keisuke
    Student affiliation
    早稲田大学
    Author(s), journal, volume number, pagination (year of publication)
    K. Motoki, Y. Miyazawa, D. Kobayashi, M. Ikegami, T. Miyasaka, T. Yamamoto, and K. Hirose, Journal of Applied Physics, 121 (8) pp. 085501-1-085501-4 (2017)
    Title
    Degradation of CH3NH3PbI3 perovskite due to soft x-ray irradiation as analyzed by an x-ray photoelectron spectroscopy time-dependent measurement method
    DOI
    https://doi.org/10.1063/1.4977238
  • Student name
    Itsuji Hiroaki
    Student affiliation
    東京大学
    Author(s), journal, volume number, pagination (year of publication)
    H. Itsuji, D. Kobayashi, O. Kawasaki, D. Matsuura, T. Narita, M. Kato, S. Ishii, K. Masukawa, and K. Hirose, IEEE Transactions on Nuclear Science, 65 (1) pp. 346-353 (2018)
    Title
    Laser visualization of the development of long line-type multi-cell upsets in back-biased SOI SRAMs
    DOI
    https://doi.org/10.1109/TNS.2017.2776169
  • Student name
    Yamaguchi Kikou
    Student affiliation
    早稲田大学
    Author(s), journal, volume number, pagination (year of publication)
    K. Yamaguchi, D. Kobayashi, T. Yamamoto, and K. Hirose, Physica B, 532 pp. 99-102 (2018)
    Title
    Theoretical investigation of the breakdown electric field of SiC polymorphs
    DOI
    https://doi.org/10.1016/j.physb.2017.03.042
  • Student name
    Chung Chin-Han
    Student affiliation
    東京大学
    Author(s), journal, volume number, pagination (year of publication)
    C-H. Chung, D. Kobayashi, and K. Hirose, IEEE Transactions on Device and Materials Reliability, 18 (4) pp. 574-582 (2018)
    Title
    Resistance-based modeling for soft errors in SOI SRAMs caused by radiation-induced potential perturbation under the BOX
    DOI
    https://doi.org/10.1109/TDMR.2018.2873220

● 専任大学名

 2
  • Affiliation (university)
    総合研究大学院大学（SOKENDAI)
  • Affiliation (university)
    東京大学（University of Tokyo)

● 所属する所内委員会

 8
  • ISAS Committee
    電子部品デバイス・電源グループ
  • ISAS Committee
    宇宙科学技術・専門統括
  • ISAS Committee
    宇宙科学基盤技術統括
  • ISAS Committee
    宇宙機応用工学研究系
  • ISAS Committee
    運営協議会委員
  • ISAS Committee
    知財委員
  • ISAS Committee
    研究所会議構成員
  • ISAS Committee
    宇宙工学委員会委員
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